ANGLE-RESOLVED PHOTOEMISSION-STUDY OF A SINGLE-DOMAIN SI(001)2X1-K SURFACE WITH SYNCHROTRON RADIATION - SYMMETRY AND DISPERSION OF SURFACE-STATES

被引：32

作者：

ABUKAWA, T

KASHIWAKURA, T

OKANE, T

SASAKI, Y

TAKAHASHI, H

ENTA, Y

SUZUKI, S

KONO, S

SATO, S

KINOSHITA, T

KAKIZAKI, A

ISHII, T

PARK, CY

YU, SW

SAKAMOTO, K

SAKAMOTO, T

机构：

[1] UNIV TOKYO, INST SOLID STATE PHYS, SYNCHROTRON RADIAT LAB, TOKYO 106, JAPAN

[2] SUNGKYUNKWAN UNIV, FAC SCI, DEPT PHYS, SUWON 440746, SOUTH KOREA

[3] ELECTROTECH LAB, TSUKUBA, IBARAKI 305, JAPAN

来源：

SURFACE SCIENCE | 1992年 / 261卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(92)90233-V

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The electronic structures of a single-domain Si(001)2 x 1 K surface at saturation coverage have been studied by synchrotron radiation (SR) angle resolved photoelectron spectroscopy (ARPES). The ARPES spectra have been measured along several symmetry axes of the 2 x 1 surface Brillouin zone and surface state dispersions are depicted. Symmetry properties of upper surface-state bands are determined using the linearly polarized character of SR. The symmetrics and dispersions of the upper surface states determined here are consistent with those expected for a K double-layer model.

引用

页码：217 / 223

页数：7

共 19 条

[1] PHOTOELECTRON DIFFRACTION AND LOW-ENERGY ELECTRON-DIFFRACTION STUDIES OF CS, K/SI(001) SURFACES [J].