ELECTRICAL CHARACTERIZATION AND MODELING OF ALTERNATING-CURRENT THIN-FILM ELECTROLUMINESCENT DEVICES

被引：18

作者：

DAVIDSON, JD

WAGER, JF

KHORMAEI, RI

KING, CN

WILLIAMS, R

机构：

[1] DAVID SARNOFF RES CTR,PRINCETON,NJ 08543

[2] PLANAR SYST INC,CORP STRATEG PLANNING GRP,BEAVERTON,OR 97006

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1992年 / 39卷 / 05期

关键词：

D O I：

10.1109/16.129092

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electrical characterization of evaporated ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is accomplished by capacitance-voltage (C-V) analysis. Interpretation of these C-V characteristics is aided by SPICE modeling and by electrical characterization of an ideal ACTFEL device constructed from discrete components, based on a simple equivalent circuit for the ACTFEL device. Various features of the C-V curve are ascribed to equivalent circuit parameters and associated device physics parameters.

引用

页码：1122 / 1128

页数：7

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