共 101 条
- [1] FACTORS CONTRIBUTING TO CMOS STATIC RAM UPSET [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) : 1524 - 1529
- [2] Beasom J. D., 1981, International Electron Devices Meeting, P350
- [5] BERNARD JA, 5TH T S SPAC NUCL PO, P589
- [7] BLAKEMORE JS, 1974, SOLID STATE PHYS, P330
- [8] BLEWER RS, 1987, OCT M EL SOC HON
- [9] HOLE TRANSPORT AND TRAPPING IN FIELD OXIDES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) : 3940 - 3945
- [10] Brown D. M., 1986, International Electron Devices Meeting 1986. Technical Digest (Cat. No.86CH2381-2), P66