SCANNING TUNNELING MICROSCOPE IMAGING TECHNIQUE FOR WEAKLY BONDED SURFACE DEPOSITS

被引：24

作者：

JERICHO, MH ^{[1
]}

BLACKFORD, BL ^{[1
]}

DAHN, DC ^{[1
]}

机构：

[1] TECH UNIV NOVA SCOTIA,DEPT ENGN PHYS,HALIFAX B3J 2X1,NS,CANADA

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 65卷 / 12期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.343166

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5237 / 5239

页数：3

共 7 条

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[2]

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[3]

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BREU, H ;

LEVAI, N ;

BAUMEISTER, W .

ULTRAMICROSCOPY, 1988, 25 (02) :111-121

[5] SCANNING TUNNELING MICROSCOPY [J].

HANSMA, PK ;

TERSOFF, J .

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[6] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE [J].

MAMIN, HJ ;

GANZ, E ;

ABRAHAM, DW ;

THOMSON, RE ;

CLARKE, J .

PHYSICAL REVIEW B, 1986, 34 (12) :9015-9018

[7]

SMITH D, IN PRESS J MICROSC

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