SYNCHROTRON X-RAY-DIFFRACTION STUDY OF THE DISORDERING OF THE GE(111) SURFACE AT HIGH-TEMPERATURES

被引:29
作者
MAK, A
EVANSLUTTERODT, KW
BLUM, K
NOH, DY
BROCK, JD
HELD, GA
BIRGENEAU, RJ
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
[2] IBM CORP,TJ WATSON RES CTR,YORKTOWN HTS,NY 10598
[3] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14853
关键词
D O I
10.1103/PhysRevLett.66.2002
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The Ge(111) surface has been reported to undergo a disordering phase transition at approximately 1050 K. Our synchrotron x-ray diffraction study demonstrates that there is, instead, a progressive disordering of the topmost layers, which retain long-range order up to at least 1150 K. Neither diffuse scattering associated with roughening or surface melting nor effects due to surface incommensurability are observed. A model involving a proliferation of surface vacancies gives a consistent description of the data.
引用
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页码:2002 / 2005
页数:4
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