SCHOTTKY BARRIER COLD CATHODE

被引:3
作者
STOLTE, CA
VILMS, J
ARCHER, RJ
机构
[1] Hewlett-Packard Laboratories, Palo Alto
关键词
D O I
10.1016/0038-1101(69)90015-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cathodic vacuum emission from forward biased, rectifying contacts between n-type GaP, ZnSe and ZnS and thin Ag films covered with a monolayer of Cs agrees with a simple theory which assumes isotropic scattering of hot electrons on transmission through the interface between the semiconductor and the Ag. The maximum measured emission efficiency is 6 × 10-3 per cent but at least 2 per cent is expected with further development. © 1969.
引用
收藏
页码:945 / &
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