HIGH-RESOLUTION FORCE MICROSCOPY OF INPLANE MAGNETIZATION

被引：4

作者：

ABRAHAM, DW ^{[1
]}

WILLIAMS, CC ^{[1
]}

WICKRAMASINGHE, HK ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,DIV RES,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01459.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：863 / 869

页数：7

共 8 条

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[8]

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