AN ELECTROCHEMICAL AND SPECTROELECTROCHEMICAL ANALYSIS OF THE OXIDE PARA-INDIUM PHOSPHIDE SEMICONDUCTOR SURFACE USING FOURIER-TRANSFORM INFRARED AND RAMAN-SCATTERING SPECTROSCOPIES

被引：7

作者：

LI, JG ^{[1
]}

PONS, S ^{[1
]}

机构：

[1] UNIV UTAH,DEPT CHEM,SALT LAKE CITY,UT 84112

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1987年 / 233卷 / 1-2期

关键词：

D O I：

10.1016/0022-0728(87)85001-5

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1 / 18

页数：18

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