FLICKER (1/F) NOISE IN BIEPITAXIAL GRAIN-BOUNDARY JUNCTIONS OF YBA2CU3O7-X

被引：72

作者：

MIKLICH, AH

CLARKE, J

COLCLOUGH, MS

CHAR, K

机构：

[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720

[2] CONDUCTUS INC,SUNNYVALE,CA 94086

来源：

APPLIED PHYSICS LETTERS | 1992年 / 60卷 / 15期

关键词：

D O I：

10.1063/1.107147

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

At low frequencies f the 1/f noise power in single biepitaxial junctions of YBa2Cu3 O7-x peaks sharply for bias currents just above the noise reduced critical current and increases as I2 for high bias currents I. This behavior is explained by a model in which both critical current fluctuations delta-I0 and resistance fluctuations delta-R contribute to the measured voltage noise. The magnitude of the normalized critical-current fluctuations \delta-I0/I0\ is alway much greater than that of the normalized resistance fluctuations \delta-R/R\. Switching the bias current between positive and negative values at 2 kHz greatly reduces the magnitude of the 1/f noise from both sources, implying that the coherence of the noise generating process is not affected by the current reversal.

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页码：1899 / 1901

页数：3

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