ELEMENTAL ANALYSIS OF THICK AMORPHOUS SPECIMENS BY EELS

被引：9

作者：

CHENG, SC

EGERTON, RF

机构：

[1] Physics Department, University of Alberta, Edmonton

来源：

MICRON | 1993年 / 24卷 / 03期

关键词：

TEM; EELS; ANALYTICAL ELECTRON MICROSCOPY; ELEMENTAL ANALYSIS;

D O I：

10.1016/0968-4328(93)90050-B

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Changes in the relative intensity of ionization edges with increasing specimen thickness are shown to arise from the influence of elastic scattering on the energy-loss spectrum. In the case of an amorphous specimen, the resulting error in measured elemental composition can be minimised by using a medium-sized (e.g. 20 mrad) collection aperture, or may be corrected for by applying the Lenz model of elastic scattering.

引用

页码：251 / 256

页数：6

共 9 条

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CHENG, SC
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EGERTON, RF
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EGERTON, RF
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[5] LENZ F, 1954, Z NATURFORSCH A, V9, P185
[6] CALCULATION OF THE ANGULAR AND ENERGY-DISTRIBUTION OF MULTIPLE SCATTERED ELECTRONS USING FOURIER-TRANSFORMS
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[J]. ULTRAMICROSCOPY, 1989, 31 (02) : 169 - 176
[7] DYNAMIC SIMULATIONS OF ENERGY-FILTERED INELASTIC ELECTRON-DIFFRACTION PATTERNS
WANG, ZL
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1992, 48 : 674 - 688
[8] [No title captured]
[9] [No title captured]

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