DEPOSITION OF CO-CR FILMS BY MAGNETRON SPUTTERING WITH HIGHLY EFFICIENT TARGET UTILIZATION

被引:3
作者
TAKAHASHI, T
HATA, T
NAOE, M
机构
[1] KANAZAWA UNIV,FAC TECHNOL,DEPT ELECT & COMP ENGN,KANAZAWA,ISHIKAWA 920,JAPAN
[2] TOKYO INST TECHNOL,FAC ENGN,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
关键词
D O I
10.1109/20.50506
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new type of magnetron sputtering method which can highly improve the utilization efficiency of Co-Cr alloy target and suppress the bombardment of high energy particles to substrate has been developed by forming the uniform magnetic flux confined in front of the target plane. The target utilization efficiencies in area and volume were as high as about 90% and 65%, respectively. Maximum deposition rate was about 0.26 µm/min. All Co-Cr films deposited by using this method were composed of hcp phase crystallites with c-axis orientation Δθ50 ranging from 8 to 14°. The easy direction of magnetization was perpendicular to the film plane. The saturation magnetization Ms and the perpendicular coercivity Hc⊥ are in the ranges of 400~550 emu/cc and more than 1000 0e, respectively. Accordingly, a plasma confining type of sputtering method may be useful for depositing Co-Cr films at high rate as well as high target utilization efficiency without damage by plasma. © 1990 IEEE
引用
收藏
页码:112 / 114
页数:3
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