Spatial distributions of dust particles in plasmas generated by capacitively coupled radiofrequency discharges

被引:54
作者
Choi, Seung J. [1 ]
Ventzek, Peter L. G. [1 ]
Hoekstra, Robert J. [1 ]
Kushner, Mark J. [1 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
关键词
D O I
10.1088/0963-0252/3/3/027
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The transport of particles ('dust`) in low-pressure electrical glow discharges is of interest with respect to contamination of semiconductor wafers during plasma etching and deposition. The distribution of dust particles in these reactors is determined by a variety of forces, the most important being electrostatic, viscous ion drag, gravitational, thermophoretic and neutral fluid drag. In this paper we present results from a series of computer models to predict the spatial distribution of dust particles in capacitively coupled electrical glow discharges considering these forces. The results are parametrized over power deposition, gas flow and particle size. We find that the spatial distribution of dust depends on the spatial dependence of the sheaths and plasma potential in bulk plasma which in turn depend upon the electrical topography of the surfaces. Experimentally observed 'dome' and 'ring' distributions of dust particles are computationally reproduced for specific combinations of discharge power particle size and substrate topography.
引用
收藏
页码:418 / 425
页数:8
相关论文
共 27 条
[1]   TRANSPORT OF DUST PARTICLES IN GLOW-DISCHARGE PLASMAS [J].
BARNES, MS ;
KELLER, JH ;
FORSTER, JC ;
ONEILL, JA ;
COULTAS, DK .
PHYSICAL REVIEW LETTERS, 1992, 68 (03) :313-316
[2]   ELECTROSTATIC TRAPPING OF CONTAMINATION PARTICLES IN A PROCESS PLASMA ENVIRONMENT [J].
CARLILE, RN ;
GEHA, S ;
OHANLON, JF ;
STEWART, JC .
APPLIED PHYSICS LETTERS, 1991, 59 (10) :1167-1169
[3]  
CHOI SJ, 1994, IEEE T PLAS IN PRESS
[4]  
CHOI SJ, 1995, APPL PHYS LETT, V62, P2197
[5]   ELECTROSTATIC FORCES ON SMALL PARTICLES IN LOW-PRESSURE DISCHARGES [J].
DAUGHERTY, JE ;
PORTEOUS, RK ;
GRAVES, DB .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (04) :1617-1620
[6]   THE DEPENDENCE OF CONTAMINATION PARTICLE TRAPS ON WAFER MATERIAL AND TOPOGRAPHY [J].
GEHA, SG ;
CARLILE, RN ;
OHANLON, JF ;
SELWYN, GS .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (02) :374-383
[7]   PREBREAKDOWN AND BREAKDOWN PHENOMENA IN HIGH-FIELD SEMICONDUCTOR-DIELECTRIC SYSTEMS [J].
GRADINARU, G ;
SUDARSHAN, TS .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (11) :7643-7666
[8]   MONTE-CARLO HYDRODYNAMIC SIMULATION OF NEUTRAL RADICAL TRANSPORT IN LOW-PRESSURE REMOTE PLASMA ACTIVATED CHEMICAL VAPOR-DEPOSITION [J].
HARTIG, MJ ;
KUSHNER, MJ .
APPLIED PHYSICS LETTERS, 1993, 62 (14) :1594-1596
[9]   PARTICULATES IN ALUMINUM SPUTTERING DISCHARGES [J].
JELLUM, GM ;
GRAVES, DB .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (10) :6490-6496
[10]   PARTICLE THERMOPHORESIS IN LOW-PRESSURE GLOW-DISCHARGES [J].
JELLUM, GM ;
DAUGHERTY, JE ;
GRAVES, DB .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (10) :6923-6934