ELECTROSTATIC TRAPPING OF CONTAMINATION PARTICLES IN A PROCESS PLASMA ENVIRONMENT

被引:162
作者
CARLILE, RN
GEHA, S
OHANLON, JF
STEWART, JC
机构
[1] Department of Electrical and Computer Engineering, University of Arizona, Tucson
关键词
D O I
10.1063/1.105545
中图分类号
O59 [应用物理学];
学科分类号
摘要
A number of authors have observed, by using light scattering from a laser beam, contamination particles suspended in an rf process plasma. The region of space occupied by the particles appears finite, e.g., a ring; there is experimental evidence that the particles are negatively charged. We show, by using a tuned Langmuir probe, that the trap is electrostatic in nature. The volume of a trap is as much as 5 V larger in electrostatic potential than the surrounding plasma. This means that the volume of the trap is positively charged with the electric field being directed outward from the trap. Thus, negatively charged particles will flow into it. The electrostatic potential rises so rapidly at a trap boundary that a double layer may exist there. Finally, the plasma-sheath interface is found to follow the topographic contour of the rf electrode surface.
引用
收藏
页码:1167 / 1169
页数:3
相关论文
共 10 条
[1]  
Durham J. A., 1990, Microcontamination, V8, P37
[2]   PARTICULATES IN ALUMINUM SPUTTERING DISCHARGES [J].
JELLUM, GM ;
GRAVES, DB .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (10) :6490-6496
[3]  
NOWLIN RN, IN PRESS J VAC SCI T
[4]   A TUNED LANGMUIR PROBE FOR MEASUREMENTS IN RF GLOW-DISCHARGES [J].
PARANJPE, AP ;
MCVITTIE, JP ;
SELF, SA .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (11) :6718-6727
[5]   INSITU PLASMA CONTAMINATION MEASUREMENTS BY HENE LASER-LIGHT SCATTERING - A CASE-STUDY [J].
SELWYN, GS ;
MCKILLOP, JS ;
HALLER, KL ;
WU, JJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03) :1726-1731
[6]   INSITU LASER DIAGNOSTIC STUDIES OF PLASMA-GENERATED PARTICULATE CONTAMINATION [J].
SELWYN, GS ;
SINGH, J ;
BENNETT, RS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2758-2765
[7]   PARTICLE TRAPPING PHENOMENA IN RADIO-FREQUENCY PLASMAS [J].
SELWYN, GS ;
HEIDENREICH, JE ;
HALLER, KL .
APPLIED PHYSICS LETTERS, 1990, 57 (18) :1876-1878
[8]   PARTICLE DISTRIBUTIONS AND LASER PARTICLE INTERACTIONS IN AN RF DISCHARGE OF SILANE [J].
SPEARS, KG ;
ROBINSON, TJ ;
ROTH, RM .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1986, 14 (02) :179-187
[9]   PARTICLE DENSITIES IN RADIO-FREQUENCY DISCHARGES OF SILANE [J].
SPEARS, KG ;
KAMPF, RP ;
ROBINSON, TJ .
JOURNAL OF PHYSICAL CHEMISTRY, 1988, 92 (18) :5297-5302
[10]   MEASUREMENTS OF CHARGE ON SUBMICRON PARTICLES GENERATED IN A SPUTTERING PROCESS [J].
WU, JJ ;
MILLER, RJ .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (02) :1051-1054