COATES-KIKUCHI PATTERNS AND ELECTRON-SPECTROSCOPY FROM SINGLE-CRYSTALS

被引：6

作者：

WOLF, ED ^{[1
]}

COANE, PJ ^{[1
]}

机构：

[1] HUGHES RES LABS,MALIBU,CA 90265

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1973年 / 10卷 / 06期

关键词：

D O I：

10.1116/1.1318468

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1064 / 1067

页数：4

共 15 条

[1] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J].

BOOKER, GR ;

SHAW, AMB ;

WHELAN, MJ ;

HIRSCH, PB .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1185-&

[2] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J].

COATES, DG .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1179-&

[3]

HIRSCH P, PRIVATE COMMUNICATIO

[4] DEPENDENCE OF SECONDARY ELECTRON EMISSION ON CRYSTAL ORIENTATION [J].

LAPONSKY, AB ;

WHETTEN, NR .

PHYSICAL REVIEW LETTERS, 1959, 3 (11) :510-512

[5] FURTHER APPLICATIONS OF KIKUCHI DIFFRACTION PATTERNS - KIKUCHI MAPS [J].

LEVINE, E ;

BELL, WL ;

THOMAS, G .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (05) :2141-&

[6] OPTICAL PROPERTIES OF SEMICONDUCTORS [J].

PHILIPP, HR ;

EHRENREICH, H .

PHYSICAL REVIEW, 1963, 129 (04) :1550-&

[7] OPTIMUM CONDITIONS FOR GENERATING CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE [J].

SCHULSON, EM ;

VANESSEN, CG .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (03) :247-&

[8] FINE STRUCTURE OF SECONDARY EMISSION VS ANGLE OF INCIDENCE OF PRIMARY BEAM ON TITANIUM SINGLE CRYSTALS [J].

SOSHEA, RW ;

DEKKER, AJ .

PHYSICAL REVIEW, 1961, 121 (05) :1362-&

[9] ORIGIN OF ANGULAR DEPENDENCE OF SECONDARY EMISSION OF ELECTRONS FROM TUNGSTEN [J].

STERN, RM ;

TAUB, H .

PHYSICAL REVIEW LETTERS, 1968, 20 (24) :1340-&

[10] SELECTED AREA CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE [J].

VANESSEN, CG ;

SCHULSON, EM .

JOURNAL OF MATERIALS SCIENCE, 1969, 4 (04) :336-&

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