AMBIPOLAR DIFFUSION MEASUREMENTS IN SEMICONDUCTORS USING NON-LINEAR TRANSIENT GRATINGS

被引:61
作者
JARASIUNAS, K [1 ]
GERRITSEN, HJ [1 ]
机构
[1] BROWN UNIV,DEPT PHYS,PROVIDENCE,RI 02912
关键词
D O I
10.1063/1.90270
中图分类号
O59 [应用物理学];
学科分类号
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页码:190 / 193
页数:4
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