PHOTON SCANNING TUNNELING MICROSCOPE STUDY OF OPTICAL WAVE-GUIDES

被引:62
作者
TSAI, DP [1 ]
JACKSON, HE [1 ]
REDDICK, RC [1 ]
SHARP, SH [1 ]
WARMACK, RJ [1 ]
机构
[1] UNIV TENNESSEE,DEPT PHYS & ASTRON,KNOXVILLE,TN 37919
关键词
D O I
10.1063/1.103160
中图分类号
O59 [应用物理学];
学科分类号
摘要
A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.
引用
收藏
页码:1515 / 1517
页数:3
相关论文
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