PHOTON SCANNING TUNNELING MICROSCOPE STUDY OF OPTICAL WAVE-GUIDES

被引：62

作者：

TSAI, DP ^{[1
]}

JACKSON, HE ^{[1
]}

REDDICK, RC ^{[1
]}

SHARP, SH ^{[1
]}

WARMACK, RJ ^{[1
]}

机构：

[1] UNIV TENNESSEE,DEPT PHYS & ASTRON,KNOXVILLE,TN 37919

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 16期

关键词：

D O I：

10.1063/1.103160

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.

引用

页码：1515 / 1517

页数：3

共 9 条

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