DETERMINATION OF TRACES OF BORON IN SILICON

被引:25
作者
MORRISON, GH
RUPP, RL
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D O I
10.1021/ac60126a010
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
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页码:892 / 895
页数:4
相关论文
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[2]   DRIFT MOBILITIES IN SEMICONDUCTORS .2. SILICON [J].
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[3]   Blank and background effect on photographed spectral lines [J].
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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1942, 32 (02) :103-111