DIELECTRIC PROPERTIES OF EUROPIUM OXIDE-FILMS

被引:40
作者
NAKANE, H
NOYA, A
KURIKI, S
MATSUMOTO, G
机构
[1] Research Institute of Applied Electricity, Hokkaido University, Sapporo
关键词
D O I
10.1016/0040-6090(79)90438-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the dielectric properties of europium oxide films for use in thin film capacitors. Annealing is found to improve the dielectric properties of these films owing the recovery of stoichiometry in the films. © 1979.
引用
收藏
页码:291 / 293
页数:3
相关论文
共 7 条
[1]   CHEMICAL EFFECTS ON CORE-ELECTRON BINDING ENERGIES IN IODINE AND EUROPIUM [J].
FADLEY, CS ;
HAGSTROM, SB ;
KLEIN, MP ;
SHIRLEY, DA .
JOURNAL OF CHEMICAL PHYSICS, 1968, 48 (08) :3779-&
[2]  
GOLDSTEIN RM, 1967, 1967 P EL COMP C WAS, P312
[3]   AC BEHAVIOR OF VACUUM-DEPOSITED PRASEODYMIUM OXIDE-FILMS [J].
GOSWAMI, A ;
GOSWAMI, AP .
THIN SOLID FILMS, 1974, 20 (01) :S3-S6
[4]   DIELECTRIC BEHAVIOR OF DYSPROSIUM OXIDE-FILMS [J].
GOSWAMI, A ;
VARMA, RR .
THIN SOLID FILMS, 1975, 28 (02) :157-165
[5]   DIELECTRIC AND OPTICAL PROPERTIES OF ZNS FILMS [J].
GOSWAMI, A ;
GOSWAMI, AP .
THIN SOLID FILMS, 1973, 16 (02) :175-185
[6]   OPTICAL PROPERTIES AND STRUCTURE OF CERIUM DIOXIDE FILMS [J].
HASS, G ;
RAMSEY, JB ;
THUN, R .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1958, 48 (05) :324-327
[7]   UNUSUAL THICKNESS DEPENDENCE OF DIELECTRIC-CONSTANT OF ERBIUM OXIDE-FILMS [J].
SAXENA, U ;
SRIVASTAVA, ON .
THIN SOLID FILMS, 1976, 33 (02) :185-192