ORIGIN OF IMAGE STREAKS IN FIELD ION MICROSCOPY

被引：6

作者：

MURR, LE

INAL, OT

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1971年 / 4卷 / 01期

关键词：

D O I：

10.1002/pssa.2210040117

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：159 / &

共 28 条

[1] A STUDY OF FISSION FRAGMENT DAMAGE IN TUNGSTEN WITH FIELD-ION MICROSCOPE [J].

BOWKETT, KM ;

CHADDERTON, LT ;

NORDEN, H ;

RALPH, B .

PHILOSOPHICAL MAGAZINE, 1965, 11 (111) :651-+

[2] STREAK CONTRAST IN FIELD-ION MICROGRAPHS [J].

BRANDON, DG .

PHILOSOPHICAL MAGAZINE, 1966, 13 (125) :1085-&

[3] THE DIRECT OBSERVATION OF LATTICE DEFECTS BY FIELD ION MICROSCOPY [J].

BRANDON, DG ;

WALD, M .

PHILOSOPHICAL MAGAZINE, 1961, 6 (68) :1035-&

[4] COMMENTS ON OBSERVED STREAKING IN FIELD-ION MICROSCOPY IMAGES OF TUNGSTEN-10 AT PERCENT RHENIUM [J].

CLUM, JA ;

MOAZED, KL .

JOURNAL OF THE LESS-COMMON METALS, 1970, 21 (02) :203-&

[5]

GRACE FI, 1967, P ELECTRON MICROSCOP, P231

[6]

JACQUET PA, 1956, MECHANISM ELECTROLYT

[7] STREAK CONTRAST IN FIELD-ION IMAGES FROM ASYMMETRIC SPECIMENS [J].

LOBERG, B ;

NORDEN, H .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1147-&

[8]

MELMED AJ, 1968, FIELD ION MICROSCOPY, P210

[9] STRUCTURE OF ATOMICALLY SMOOTH SPHERICAL SURFACES [J].

MOORE, AJW .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1962, 23 (JUL) :907-&

[10]

Muller E W, 1969, FIELD ION MICROSCOPY

← 1 2 3 →