DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS

被引:25
作者
ANSELMETTI, D
GERBER, C
MICHEL, B
WOLF, H
GUNTHERODT, HJ
ROHRER, H
机构
[1] UNIV BASEL,INST PHYS,CH-4056 BASEL,SWITZERLAND
[2] UNIV MAINZ,INST ORGAN CHEM,W-6500 MAINZ,GERMANY
来源
EUROPHYSICS LETTERS | 1993年 / 23卷 / 06期
关键词
ELECTRON MICROSCOPY DETERMINATIONS (INC SCANNING TUNNELING MICROSCOPY METHODS); SOLID-SOLID INTERFACES (INC BICRYSTALS); MECHANICAL AND ACOUSTICAL PROPERTIES OF SOLID SURFACES AND INTERFACES;
D O I
10.1209/0295-5075/23/6/007
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. With reference to mono- and bicomponent self-assembled monolayers, we find that the characteristic depression pattern and the protrusions on a multicomponent film found in STM are to a great extent due to electronic effects.
引用
收藏
页码:421 / 426
页数:6
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