FORCE MICROSCOPY

被引：95

作者：

BINNIG, G

机构：

[1] Physics Group München, IBM Research Division, 8000 München 40

来源：

ULTRAMICROSCOPY | 1992年 / 42卷

关键词：

D O I：

10.1016/0304-3991(92)90240-K

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Although tunneling microscopy at the age of ten years is a fairly young technique, it has already produced several offspring. One of them is force microscopy, which at present is in fact the most important one in terms of the number of people dealing with it directly or indirectly. This paper discusses its strengths and limitations as well as its potential future applications.

引用

页码：7 / 15

页数：9

共 28 条

[1] IMPROVED ATOMIC FORCE MICROSCOPE IMAGES USING MICROCANTILEVERS WITH SHARP TIPS
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[3] ATOMIC FORCE MICROSCOPE
BINNIG, G
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[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[4] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE
BINNIG, G
GERBER, C
STOLL, E
ALBRECHT, TR
QUATE, CF
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[7] BORDONI F, IN PRESS
[8] IMAGING CRYSTALS, POLYMERS, AND PROCESSES IN WATER WITH THE ATOMIC FORCE MICROSCOPE
DRAKE, B
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GIMZEWSKI, JK
POHL, DW
[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (19) : 2403 - 2406
[10] GIESSIBL F, IN PRESS

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