共 12 条
[2]
KATAYAMA K, 1961, J PHYS SOC JPN, V16, P463
[3]
Kochendorfer A, 1944, Z KRISTALLOGR, V105, P393
[4]
SCHERRER P, 1920, KOLLOIDCHEMIE
[5]
INFLUENCE OF THE APPARATUS FUNCTION ON CRYSTALLITE SIZE DETERMINATIONS WITH GEIGER COUNTER SPECTROMETERS
[J].
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B,
1952, 65 (391)
:528-535
[6]
A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS
[J].
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON,
1948, 61 (346)
:382-391
[7]
TOURNARIE M, 1956, CR HEBD ACAD SCI, V242, P2161
[8]
TOURNARIE M, 1956, CR HEBD ACAD SCI, V242, P2016
[10]
ON VARIANCE AS A MEASURE OF LINE BROADENING IN DIFFRACTOMETRY .2. MISTAKES AND STRAIN
[J].
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON,
1963, 81 (519)
:41-&