THE HIGH-CONTRAST (WIDE-FIELD) ELECTRON MICROSCOPE OBJECTIVE AND FIBER REPLICAS

被引：2

作者：

MOREHEAD, FF

机构：

来源：

关键词：

D O I：

10.1177/004051755202200601

中图分类号：

TB3 [工程材料学]; TS1 [纺织工业、染整工业];

学科分类号：

0805 ; 080502 ; 0821 ;

摘要：

引用

页码：379 / 384

页数：6

共 6 条

HILLIER, J .

[2] AN ELECTRON-MICROSCOPICAL EXAMINATION OF RAYON [J].

HOCK, CW .

[3]

SIMMENS S, 1949, J TEXT I, V40, pT590

[4] A METHOD FOR THE ELECTRON MICROSCOPY OF WOOL [J].

SWERDLOW, M ;

SEEMAN, GS .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1948, 41 (03) :231-245

[5] APPLICATIONS OF METALLIC SHADOW-CASTING TO MICROSCOPY [J].

WILLIAMS, RC ;

WYCKOFF, RWG .

[6] The thickness of electron microscopic objects [J].

Williams, RC ;

Wyckoff, RWG .