The thickness of electron microscopic objects

被引:190
作者
Williams, RC
Wyckoff, RWG
机构
[1] Univ Michigan, Sch Publ Hlth, Dept Astron, Ann Arbor, MI USA
[2] Univ Michigan, Sch Publ Hlth, Virus Lab, Ann Arbor, MI USA
关键词
D O I
10.1063/1.1707376
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:712 / 716
页数:5
相关论文
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