DEUTERIUM PROFILES IN TITANIUM AND ALLOYS

Deuterium concentration profiles in Ti, T1-6A1, and Ti-6A1-4V have been investigated after 10 keV D3+ implantation at room temperature. Profiles were determined using the D(3He,α)p nuclear reaction and also by secondary ion mass spectrometry (SIMS). The amount of retained D in the near-surface region (~.5 μm) was monitored as a function of time and was found to be strongly microstructure dependent. Annealed Ti retained the most D while the Ti-6A1-4V alloy retained the least D in this region. The D remained in the bulk of the sample during implant and subsequent aging at room temperature. © 1979.