REVIEW ON DEPTH PROFILING OF HYDROGEN AND HELIUM ISOTOPES WITHIN NEAR-SURFACE REGION OF SOLIDS BY USE OF ION-BEAMS

被引：59

作者：

BOTTIGER, J

机构：

来源：

JOURNAL OF NUCLEAR MATERIALS | 1978年 / 78卷 / 01期

关键词：

D O I：

10.1016/0022-3115(78)90515-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：161 / 181

页数：21

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