REVIEW ON DEPTH PROFILING OF HYDROGEN AND HELIUM ISOTOPES WITHIN NEAR-SURFACE REGION OF SOLIDS BY USE OF ION-BEAMS

被引:59
作者
BOTTIGER, J
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关键词
D O I
10.1016/0022-3115(78)90515-9
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:161 / 181
页数:21
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