ANALYSIS OF TEM(OO) LASER-BEAM QUALITY DEGRADATION CAUSED BY A BIREFRINGENT ND-YAG ROD

被引：37

作者：

LU, QT

DONG, SL

WEBER, H

机构：

[1] Festkörper-Laser-Institut Berlin GmbH, Berlin, D-10623

来源：

OPTICAL AND QUANTUM ELECTRONICS | 1995年 / 27卷 / 09期

关键词：

D O I：

10.1007/BF00567553

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The effects produced by a birefringent rod on the beam quality factor, M(r)(2), of a Gaussian TEM(00) laser beam are studied. Analytical expressions for the beam parameters at the output plane of a rod amplifier are derived. The theory predicts that the beam quality degrades rapidly with the heat power dissipated in the rod.

引用

页码：777 / 783

页数：7

共 17 条

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