STRUCTURE AND GROWTH-MORPHOLOGY OF SIOX FILMS DEPOSITED ON NACL (001) FACES

[1] Barna A., 1976, Proceedings of the International Conference on Amorphous Semiconductors, P449

[2] CONDENSATION AND EPITAXIAL-GROWTH OF EVAPORATED THIN-FILMS ON NACL COVERED BY AN AMORPHOUS DIELECTRIC INTERMEDIATE LAYER [J]. ACTA PHYSICA ACADEMIAE SCIENTIARUM HUNGARICAE, 1973, 33 (3-4): : 399 - 410

[3] BARNA A, 1978, THIN SOLID FILMS, V48, P136

[4] A NEW TECHNIQUE FOR DECORATION OF CLEAVAGE AND SLIP STEPS ON IONIC CRYSTAL SURFACES [J]. PHILOSOPHICAL MAGAZINE, 1958, 3 (33): : 1042 - &

[5] Chopra K.L, 1969, THIN FILM PHENOMENA

[6] ELECTRON-MICROSCOPY EVIDENCE OF ADATOM MOBILITY IN AMORPHOUS-GERMANIUM FILMS [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (04): : 935 - 938

[7] DEPOLK, 1971, J NONCRYST SOLIDS, V5, P365

[8] COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS [J]. THIN SOLID FILMS, 1977, 47 (03) : 219 - 233

[9] Lauren P. M., 1968, JCHED, V45, pA569, DOI [10.1021/ed045pA569.2, DOI 10.1021/ED045PA569.2]

[10] ZUR DEFOKUSSIERUNGSABHANGIGKEIT DES PHASENKONTRASTES BEI DER ELEKTRONENMIKROSKOPISCHEN ABBILDUNG [J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1966, A 21 (04): : 476 - &

[1] Barna A., 1976, Proceedings of the International Conference on Amorphous Semiconductors, P449

[2] CONDENSATION AND EPITAXIAL-GROWTH OF EVAPORATED THIN-FILMS ON NACL COVERED BY AN AMORPHOUS DIELECTRIC INTERMEDIATE LAYER [J]. ACTA PHYSICA ACADEMIAE SCIENTIARUM HUNGARICAE, 1973, 33 (3-4): : 399 - 410

[3] BARNA A, 1978, THIN SOLID FILMS, V48, P136

[4] A NEW TECHNIQUE FOR DECORATION OF CLEAVAGE AND SLIP STEPS ON IONIC CRYSTAL SURFACES [J]. PHILOSOPHICAL MAGAZINE, 1958, 3 (33): : 1042 - &

[5] Chopra K.L, 1969, THIN FILM PHENOMENA

[6] ELECTRON-MICROSCOPY EVIDENCE OF ADATOM MOBILITY IN AMORPHOUS-GERMANIUM FILMS [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (04): : 935 - 938

[7] DEPOLK, 1971, J NONCRYST SOLIDS, V5, P365

[8] COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS [J]. THIN SOLID FILMS, 1977, 47 (03) : 219 - 233

[9] Lauren P. M., 1968, JCHED, V45, pA569, DOI [10.1021/ed045pA569.2, DOI 10.1021/ED045PA569.2]

[10] ZUR DEFOKUSSIERUNGSABHANGIGKEIT DES PHASENKONTRASTES BEI DER ELEKTRONENMIKROSKOPISCHEN ABBILDUNG [J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1966, A 21 (04): : 476 - &