MINORITY-CARRIER LIFETIME MEASUREMENT IN HF SOLUTION TO EVALUATE SI SUBSTRATES FOR SOLAR-CELLS

被引：9

作者：

NAMMORI, T ^{[1
]}

OKAMOTO, K ^{[1
]}

NUNOI, T ^{[1
]}

HAYASHI, Y ^{[1
]}

机构：

[1] ELECTROTECH LAB,TSUKUBA,IBARAKI 305,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 01期

关键词：

Effective lifetime measurement; HF solution; Microwave photoconductivity decay method; Solar cell; Surface recombination velocity;

D O I：

10.1143/JJAP.29.L166

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Minority carrier lifetime measurement using a microwave photoconductivity decay method was examined. A simple method of immersing a silicon wafer in a toxic HF solution by using a plastic envelope is introduced. An effective lifetime in 50% HF solution is much higher than that in air due to reduction of the surface recombination velocity and is almost the same compared with that of an oxidized and well-passivated substrate. This method provides the effective lifetime, which approximates a bulk lifetime, without an oxide layer and is useful in estimating the short circuit current of solar cells prior to the cell fabrication. © 1990 IOP Publishing Ltd.

引用

页码：L166 / L168

页数：3