DIRECT ANALYSIS OF THIN LAYERS BY SPARK SOURCE MASS SPECTROGRAPHY

[1] MASS SPECTROGRAPHIC DETECTION OF IMPURITIES INN LIQUIDS [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (07) : 1197 - &

[2] AXELROD NN, 1969, PHYSICAL MEASUREMENT, P159

[3] BINGHAM R, 1967, 7 P ANN MS7 US C MAN

[4] BROWN R, 1968, 16 ANN C MASS SPECTR

[5] DIE BESCHLEUNIGUNG POSITIVER UND NEGATIVER LONEN IM WECHSELFELD DES VAKUUM-HOCHFREQUENZFUNKENS NACH DEMPSTER [J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1963, A 18 (03): : 410 - +

[6] MASS SPECTROGRAPH FOR ANALYSIS OF SOLIDS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (07) : 783 - &

[7] HICKAM WM, 1966, MASS SPECTROMETRIC A, P138

[8] MALM DL, 1969, PHYSICAL MEASUREMENT, P158

[9] MILLETT EJ, 1965, Patent No. 45912

[10] MILLETT EJ, 1966, 6 ANN MS7 US C MANCH

[1] MASS SPECTROGRAPHIC DETECTION OF IMPURITIES INN LIQUIDS [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (07) : 1197 - &

[2] AXELROD NN, 1969, PHYSICAL MEASUREMENT, P159

[3] BINGHAM R, 1967, 7 P ANN MS7 US C MAN

[4] BROWN R, 1968, 16 ANN C MASS SPECTR

[5] DIE BESCHLEUNIGUNG POSITIVER UND NEGATIVER LONEN IM WECHSELFELD DES VAKUUM-HOCHFREQUENZFUNKENS NACH DEMPSTER [J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1963, A 18 (03): : 410 - +

[6] MASS SPECTROGRAPH FOR ANALYSIS OF SOLIDS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (07) : 783 - &

[7] HICKAM WM, 1966, MASS SPECTROMETRIC A, P138

[8] MALM DL, 1969, PHYSICAL MEASUREMENT, P158

[9] MILLETT EJ, 1965, Patent No. 45912

[10] MILLETT EJ, 1966, 6 ANN MS7 US C MANCH