ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL

被引:171
作者
BECKER, P
DORENWENDT, K
EBELING, G
LAUER, R
LUCAS, W
PROBST, R
RADEMACHER, HJ
REIM, G
SEYFRIED, P
SIEGERT, H
机构
关键词
D O I
10.1103/PhysRevLett.46.1540
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
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页码:1540 / 1543
页数:4
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