ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL

[1] SIMPLE BRAGG-SPACING COMPARATOR [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (JUL): : 484 - 489

[2] BECKER P, 1979, NEUTRON INTERFEROMET, P416

[3] A 2-CRYSTAL X-RAY INTERFEROMETER [J]. ZEITSCHRIFT FUR PHYSIK, 1968, 214 (01): : 16 - &

[4] PRINCIPLES AND DESIGN OF LAUE-CASE X-RAY INTERFEROMETERS [J]. ZEITSCHRIFT FUR PHYSIK, 1965, 188 (02): : 154 - &

[5] Bonse U., COMMUNICATION

[6] CURTIS I, 1971, PRECISION MEASUREMEN, P285

[7] Deslattes R. D., 1980, Accuracy in Powder Diffraction, Symposium Proceedings, P55

[8] X-RAY TO VISIBLE WAVELENGTH RATIOS [J]. PHYSICAL REVIEW LETTERS, 1973, 31 (16) : 972 - 975

[9] DESLATTES RD, 1980, ANNU REV PHYS CHEM, V31, P435, DOI 10.1146/annurev.pc.31.100180.002251

[10] AVOGADRO CONSTANT - CORRECTIONS TO AN EARLIER REPORT [J]. PHYSICAL REVIEW LETTERS, 1976, 36 (15) : 898 - 900

[1] SIMPLE BRAGG-SPACING COMPARATOR [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (JUL): : 484 - 489

[2] BECKER P, 1979, NEUTRON INTERFEROMET, P416

[3] A 2-CRYSTAL X-RAY INTERFEROMETER [J]. ZEITSCHRIFT FUR PHYSIK, 1968, 214 (01): : 16 - &

[4] PRINCIPLES AND DESIGN OF LAUE-CASE X-RAY INTERFEROMETERS [J]. ZEITSCHRIFT FUR PHYSIK, 1965, 188 (02): : 154 - &

[5] Bonse U., COMMUNICATION

[6] CURTIS I, 1971, PRECISION MEASUREMEN, P285

[7] Deslattes R. D., 1980, Accuracy in Powder Diffraction, Symposium Proceedings, P55

[8] X-RAY TO VISIBLE WAVELENGTH RATIOS [J]. PHYSICAL REVIEW LETTERS, 1973, 31 (16) : 972 - 975

[9] DESLATTES RD, 1980, ANNU REV PHYS CHEM, V31, P435, DOI 10.1146/annurev.pc.31.100180.002251

[10] AVOGADRO CONSTANT - CORRECTIONS TO AN EARLIER REPORT [J]. PHYSICAL REVIEW LETTERS, 1976, 36 (15) : 898 - 900