A STUDY OF ANTIPHASE BOUNDARIES AND 223 PLANAR FAULTS IN EPITAXIAL YBA2CU3O7 FILMS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：16

作者：

JIA, CL ^{[1
]}

SOLTNER, H ^{[1
]}

KABIUS, B ^{[1
]}

POPPE, U ^{[1
]}

URBAN, K ^{[1
]}

SCHUBERT, J ^{[1
]}

机构：

[1] FORSCHUNGSZENTRUM JULICH GMBH,INST SCHICHT & IONENTECH,W-5170 JULICH,GERMANY

来源：

PHYSICA C | 1991年 / 182卷 / 1-3期

关键词：

D O I：

10.1016/0921-4534(91)90475-E

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The atomic structure of antiphase boundaries in YBa2Cu3O7 thin films has been characterized by means of high resolution transmission electron microscopy. Two kinds of antiphase boundaries were found, conservative and nonconservative. The nonconservative antiphase boundaries can be related to either intrinsic or extrinsic faults. The antiphase boundaries usually end at planar defects in the a-b plane. In addition, "223" planar faults have been observed. This type of defect includes both an extra Y and an extra O layer inserted parallel to the a-b plane at the z = 1/2 position of the YBa2Cu3O7 structure.

引用

页码：163 / 170

页数：8

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