METHOD FOR MEASURING INCIDENT-BEAM ENERGY IN SCANNING ELECTRON MICROSCOPY USING ELECTRON CHANNELLING PATTERNS

被引：8

作者：

SCHULSON, EM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1971年 / 42卷 / 10期

关键词：

D O I：

10.1063/1.1659703

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3894 / &

共 9 条

[1] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J].

BOOKER, GR ;

SHAW, AMB ;

WHELAN, MJ ;

HIRSCH, PB .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1185-&

[2] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J].

COATES, DG .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1179-&

[3] IMPROVEMENTS IN ORIENTATION EFFECT OBSERVED BY SCANNING ELECTRON MICROSCOPY [J].

COATES, DG .

PHYSICA STATUS SOLIDI, 1968, 27 (01) :K11-&

[4]

HIRSCH P, PRIVATE COMMUNICATIO

[5] ELECTRON CHANNELLING PATTERNS FROM FERROMAGNETIC CRYSTALS IN SCANNING ELECTRON MICROSCOPE [J].

JOY, DC ;

SCHULSON, EM ;

JAKUBOVICS, JP ;

VANESSEN, CG .

PHILOSOPHICAL MAGAZINE, 1969, 20 (166) :843-+

[6] SOME CONSIDERATIONS OF SELECTED AREA CHANNELLING IN SCANNING ELECTRON MICROSCOPE [J].

SCHULSON, EM .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (04) :361-&

[7]

SCHULSON EM, TO BE PUBLISHED

[8] FURTHER COMMENTS ON ORIGIN OF ORIENTATION-DEPENDENT PATTERNS OBTAINED IN SCANNING ELECTRON MICROSCOPE [J].

SHAW, AMB ;

BOOKER, GR ;

COATES, DG .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (03) :243-&

[9] ELECTRON BEAM CHANNELING IN SINGLE-CRYSTAL SILICON BY SCANNING ELECTRON MICROSCOPY [J].

WOLF, ED ;

EVERHART, TE .

APPLIED PHYSICS LETTERS, 1969, 14 (10) :299-&

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