LAYERED SYNTHETIC MICROSTRUCTURES AS DISPERSING DEVICES IN X-RAY SPECTROMETERS

被引：19

作者：

GILFRICH, JV ^{[1
]}

NAGEL, DJ ^{[1
]}

BARBEE, TW ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT MAT SCI & ENGN,STANFORD,CA 94305

来源：

关键词：

D O I：

10.1366/0003702824639024

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：58 / 61

页数：4

共 17 条

[1] BARBEE TW, 1978, MAY WORKSH XRAY INST, P3
[2] BARBEE TW, 1981, P TOPICAL C LOW ENER
[3] Brown Denys, 1981, COMMUNICATION
[4] Deubner W, 1930, ANN PHYS-BERLIN, V5, P261
[5] X-RAY DIFFRACTION BY MULTILAYERED THIN-FILM STRUCTURES AND THEIR DIFFUSION
DINKLAGE, JB
[J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (09) : 3781 - &
[6] An X-ray method of determining rates of diffusion in the solid state
DuMond, J
Youtz, JP
[J]. JOURNAL OF APPLIED PHYSICS, 1940, 11 (05) : 357 - 365
[7] GILFRICH JV, 1975, APPL SPECTROSC, V29, P322, DOI 10.1366/000370275774455914
[8] APPLICATION OF GRAPHITE MONOCHROMATOR TO LIGHT ELEMENT X-RAY SPECTROSCOPY
GOULD, RW
BATES, SR
SPARKS, CJ
[J]. APPLIED SPECTROSCOPY, 1968, 22 (5P1) : 549 - &
[9] HENKE BL, 1975, ADV XRAY ANAL, V18, P87
[10] LOTER NG, 1981, UNPUB