SILICON-NITRIDE FROM MICROWAVE PLASMA - FABRICATION AND CHARACTERIZATION

被引:11
作者
TESSIER, Y
KLEMBERGSAPIEHA, JE
POULINDANDURAND, S
WERTHEIMER, MR
GUJRATHI, S
机构
[1] ECOLE POLYTECH,DEPT GEN PHYS,MONTREAL H3C 3A7,QUEBEC,CANADA
[2] UNIV MONTREAL,DEPT PHYS,PHYS NUCL LAB,MONTREAL H3C 3J7,QUEBEC,CANADA
关键词
D O I
10.1139/p87-132
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:859 / 863
页数:5
相关论文
共 23 条
[1]  
CARON M, 1986, 170TH EL SOC M SAN D, P584
[2]  
CHAUSSAT C, THESIS U GRENOBLE GR
[3]   HYDROGEN CONTENT OF A VARIETY OF PLASMA-DEPOSITED SILICON NITRIDES [J].
CHOW, R ;
LANFORD, WA ;
WANG, KM ;
ROSLER, RS .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) :5630-5633
[4]   CHARACTERIZATION OF PLASMA SILICON-NITRIDE LAYERS [J].
CLAASSEN, WAP ;
VALKENBURG, WGJN ;
HABRAKEN, FHPM ;
TAMMINGA, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (12) :2419-2423
[5]   DECAPSULATION AND PHOTORESIST STRIPPING IN OXYGEN MICROWAVE PLASMAS [J].
DZIOBA, S ;
ESTE, G ;
NAGUIB, HM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (11) :2537-2541
[6]   TIME-OF-FLIGHT SYSTEM FOR PROFILING RECOILED LIGHT-ELEMENTS [J].
GROLEAU, R ;
GUJRATHI, SC ;
MARTIN, JP .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :11-15
[7]  
HOLLAHAN JR, 1978, THIN FILM PROCESSES, P335
[8]  
HUDGENS SJ, 1985, MATER RES SOC S P, V49, P403
[9]   AMORPHOUS-SILICON SILICON-OXYNITRIDE FIELD-EFFECT TRANSISTORS [J].
ISHIBASHI, K ;
MATSUMURA, M .
APPLIED PHYSICS LETTERS, 1982, 41 (05) :454-456
[10]  
KAGANOWICZ G, 1984, 34TH CAN CHEM ENG C