RADIATION EFFECTS IN SIO2 UNDER ELECTRONIC EXCITATION

被引：26

作者：

DURAUD, JP ^{[1
]}

JOLLET, F ^{[1
]}

LANGEVIN, Y ^{[1
]}

DOORYHEE, E ^{[1
]}

机构：

[1] LAB RENE BERNAS,F-91406 ORSAY,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 32卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(88)90218-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：248 / 257

页数：10

相关论文

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