ACCESSORY FOR SPECULAR REFLECTANCE MEASUREMENTS WITH DOUBLE-BEAM SPECTROPHOTOMETERS

被引：4

作者：

CAPPUCCIO, G

DANGELO, S

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1978年 / 11卷 / 04期

关键词：

D O I：

10.1088/0022-3735/11/4/006

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：298 / 299

页数：2

共 10 条

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[2] A SENSITIVE SINGLE BEAM DEVICE FOR CONTINUOUS REFLECTANCE OR TRANSMITTANCE MEASUREMENTS
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[3] CHOPRA KL, 1969, THIN FILM PHENOMENA, P732
[4] THIN-FILM INFRARED DETECTOR ARRAYS FOR INTEGRATED ELECTRONIC-STRUCTURES
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[J]. INFRARED PHYSICS, 1976, 16 (1-2): : 37 - 45
[5] DRUMMETER LF, 1964, PHYSICS THIN FILMS, V2, P336
[6] ACCURATE SINGLE BEAM, SINGLE OPTICAL PATH REFLECTOMETER FOR CONTINUOUS REFLECTANCE MEASUREMENTS
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[J]. APPLIED OPTICS, 1972, 11 (06): : 1435 - &
[7] OPTICAL-ABSORPTION IN EPITAXIAL PBTE FILMS ON BAF2
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[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) : 4907 - 4911
[8] MCKELVEY JP, 1969, SOLID STATE SEMICOND, P320
[9] CONCENTRATION-DEPENDENCE OF REFRACTIVE-INDEX FOR N-TYPE AND P-TYPE GAAS BETWEEN 1.2 AND 1.8 EV
SELL, DD
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[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (06) : 2650 - 2657
[10] STEWART JE, 1970, INFRARED SPECTROSCOP, P485