SURFACE CHARACTERIZATION BY AUGER-ELECTRON SPECTROMETRY

被引:43
作者
SICKAFUS, EN [1 ]
机构
[1] FORD MOTOR CO,SCI RES STAFF,DEARBORN,MI 48121
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1974年 / 11卷 / 01期
关键词
D O I
10.1116/1.1318603
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:299 / 311
页数:13
相关论文
共 55 条
[1]   BAND STRUCTURE OF SILICON BY CHARACTERISTIC AUGER ELECTRON SPECTRUM ANALYSIS [J].
AMELIO, GF .
SURFACE SCIENCE, 1970, 22 (02) :301-&
[2]   THE K-AUGER SPECTRUM [J].
ASAAD, WN ;
BURHOP, EHS .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1958, 71 (459) :369-382
[3]  
BECKER GE, 1972, SURF SCI, V30, P125
[4]   ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].
BISHOP, HE ;
RIVIERE, JC .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&
[5]  
BRUNDLE CR, 1972, SPECIALIST PERIODICA, V1
[6]  
BURHOP EHS, 1972, ADV ATOM MOL PHYS, V8, P164
[7]  
BURHOP EHS, 1952, AUGER EFFECT OTHER R
[8]  
BURHOP HS, 1940, P CAMB PHILOS SOC, V36, P43
[9]  
CATHILL JR, 1967, PHYS REV, V164, P1006
[10]   AUGER ELECTRON SPECTROSCOPY [J].
CHANG, CC .
SURFACE SCIENCE, 1971, 25 (01) :53-+