DETERMINATION OF SURFACE-ROUGHNESS FROM LIGHT-SCATTERING MEASUREMENTS

被引：24

作者：

HEITMANN, D ^{[1
]}

PERMIEN, V ^{[1
]}

机构：

[1] INST ANGEW PHYIK,D-2000 HAMBURG 36,FED REP GER

来源：

OPTICS COMMUNICATIONS | 1977年 / 23卷 / 01期

关键词：

D O I：

10.1016/0030-4018(77)90143-2

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：131 / 134

页数：4

共 14 条

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[9] DETERMINATION OF SURFACE-ROUGHNESS OF THIN-FILMS USING MEASUREMENT OF ANGULAR-DEPENDENCE OF SCATTERED LIGHT FROM SURFACE PLASMA-WAVES [J].

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[10]

Kretschmann E., 1972, Optics Communications, V6, P185, DOI 10.1016/0030-4018(72)90224-6

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