CHARACTERIZATION OF OPTICAL THIN-FILMS

被引：256

作者：

PULKER, HK

机构：

[1] Balzers Ltd., Balzers

来源：

APPLIED OPTICS | 1979年 / 18卷 / 12期

关键词：

D O I：

10.1364/AO.18.001969

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Various properties of dielectric thin films are discussed in this paper: Refractive index and absorption coefficient, light scattering, structure, microstructure, density, gas sorption, chemical composition, homogeneity, adhesion, hardness and mechanical stress, and environmental influences. © 1979 Optical Society of America.

引用

页码：1969 / 1977

页数：9

共 86 条

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