共 18 条
AN A-SI-H/A-SI, GE-H BULK BARRIER PHOTOTRANSISTOR WITH A-SIC-H BARRIER ENHANCEMENT LAYER FOR HIGH-GAIN IR OPTICAL-DETECTOR
被引:26
作者:

HWANG, SB
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机构: VLSI Technology Laboratory, National Cheng Kung University, Tainan, ROC

FANG, YK
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机构: VLSI Technology Laboratory, National Cheng Kung University, Tainan, ROC

CHEN, KH
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机构: VLSI Technology Laboratory, National Cheng Kung University, Tainan, ROC

LIU, CR
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机构: VLSI Technology Laboratory, National Cheng Kung University, Tainan, ROC

HWANG, JD
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机构: VLSI Technology Laboratory, National Cheng Kung University, Tainan, ROC

CHOU, MH
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机构: VLSI Technology Laboratory, National Cheng Kung University, Tainan, ROC
机构:
[1] VLSI Technology Laboratory, National Cheng Kung University, Tainan, ROC
关键词:
D O I:
10.1109/16.202783
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In this paper, the design and fabrication of a high-gain amorphous silicon/amorphous silicon germanium (a-Si:H/a-Si,Ge:H) bulk barrier phototransistor for infrared light detection application are reported. The a-Si,Ge:H material featured lower energy gap and is suitable for the absorption of longer wave light, but it also leads to a low breakdown voltage and high dark current. We used an additional a-SiC: H thin-film layer at the collector/base interface in the conventional amorphous bulk barrier phototransistor to enhance the function of bulk barrier and obtain high optical gain.
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页码:721 / 726
页数:6
相关论文
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