BACKGROUND REDUCTION OF X-RAY-FLUORESCENCE SPECTRA IN A SECONDARY TARGET ENERGY DISPERSIVE SPECTROMETER

被引：53

作者：

STANDZENIEKS, P

SELIN, E

机构：

[1] Department of Physics, Chalmers University of Technology, Göteborg

来源：

NUCLEAR INSTRUMENTS & METHODS | 1979年 / 165卷 / 01期

关键词：

D O I：

10.1016/0029-554X(79)90308-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Improved peak-to-background ratios for trace element analysis have been obtained in a conventional spectrometer. The integrated number of background counts is ∼0.5% of the high energy scattered radiation. © 1979.

引用

页码：63 / 65

页数：3

共 6 条

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BISGARD KM, UNPUBLISHED

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[3] XRF ANALYSIS - SOME SENSITIVITY COMPARISONS BETWEEN CHARGED-PARTICLE AND PHOTON EXCITATION [J].

GOULDING, FS ;

JAKLEVIC, JM .

NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2) :323-332

[4]

GOULDING FS, 1972, ADVAN XRAY ANAL, V15, P470

[5]

RYON RW, 1976, ADV XRAY ANAL, V20, P575

[6] DEVELOPMENT OF A LOW-POWER MONOENERGETIC X-RAY TUBE FOR TRACE-ELEMENT ANALYSIS [J].

STANDZENIEKS, P ;

RINDBY, A ;

SELIN, E .

NUCLEAR INSTRUMENTS & METHODS, 1978, 153 (01) :269-276

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