EFFECTS OF TEMPERATURE ON CONTACT RESISTANCE OF GUNN DIODES

被引:16
作者
BOLTON, RMG
JONES, BF
机构
[1] University of Oxford Department of Engineering Science, Oxford, Parks Road
关键词
D O I
10.1049/el:19690495
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two different sets of experiments on the effect of temperature on Gunn diodes with Ag-Sn metal contacts have indicated the presence of a contact resistance which can be characterised by an activation energy. A model based on the diffusion of copper into the active region is put forward to account for the origin of the contact resistance and its variation with temperature. © 1969, The Institution of Electrical Engineers. All rights reserved.
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页码:662 / +
页数:1
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