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HYDRIDES AND HYDROXYLS IN THIN SILICON DIOXIDE FILMS
被引:150
作者
:
BECKMANN, KH
论文数:
0
引用数:
0
h-index:
0
BECKMANN, KH
HARRICK, NJ
论文数:
0
引用数:
0
h-index:
0
HARRICK, NJ
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1971年
/ 118卷
/ 04期
关键词
:
D O I
:
10.1149/1.2408122
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:614 / &
相关论文
共 27 条
[1]
INVESTIGATION OF CHEMICAL PROPERTIES OF STAIN FILMS ON SILICON BY MEANS OF INFRARED SPECTROSCOPY
BECKMANN, KH
论文数:
0
引用数:
0
h-index:
0
BECKMANN, KH
[J].
SURFACE SCIENCE,
1965,
3
(04)
: 314
-
&
[2]
BRUNNER GO, 1961, Z ELEKTROCHEM, V65, P735
[3]
TRACER EVALUATION OF HYDROGEN IN STEAM-GROWN SIO2 FILMS
BURKHARD.PJ
论文数:
0
引用数:
0
h-index:
0
BURKHARD.PJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(2P1)
: 196
-
&
[4]
CHARACTERISTICS OF FAST SURFACE STATES ASSOCIATED WITH SIO2-SI AND SI3N4-SIO2-SI STRUCTURES
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, California
DEAL, BE
MACKENNA, EL
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, California
MACKENNA, EL
CASTRO, PL
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, California
CASTRO, PL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(07)
: 997
-
&
[5]
A-C PROPERTIES OF ANODIC OXIDE FILMS ON SILICON
DREINER, R
论文数:
0
引用数:
0
h-index:
0
DREINER, R
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(11)
: 1210
-
+
[6]
EICHENWALD A, 1910, ANN PHYS, V32, P648
[7]
ELECTRIC FIELDS PRODUCED BY PROPAGATION OF PLANE COHERENT ELECTROMAGNETIC RADIATION IN A STRATIFIED MEDIUM
HANSEN, WN
论文数:
0
引用数:
0
h-index:
0
HANSEN, WN
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1968,
58
(03)
: 380
-
&
[8]
Harrick N. J., 1967, INTERNAL REFLECTION
[9]
HARRICK NJ, 1967, INTERNAL REFLECTION, P41
[10]
HARRICK NJ, 1967, INTERNAL REFLECTANCE, P262
←
1
2
3
→
共 27 条
[1]
INVESTIGATION OF CHEMICAL PROPERTIES OF STAIN FILMS ON SILICON BY MEANS OF INFRARED SPECTROSCOPY
BECKMANN, KH
论文数:
0
引用数:
0
h-index:
0
BECKMANN, KH
[J].
SURFACE SCIENCE,
1965,
3
(04)
: 314
-
&
[2]
BRUNNER GO, 1961, Z ELEKTROCHEM, V65, P735
[3]
TRACER EVALUATION OF HYDROGEN IN STEAM-GROWN SIO2 FILMS
BURKHARD.PJ
论文数:
0
引用数:
0
h-index:
0
BURKHARD.PJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(2P1)
: 196
-
&
[4]
CHARACTERISTICS OF FAST SURFACE STATES ASSOCIATED WITH SIO2-SI AND SI3N4-SIO2-SI STRUCTURES
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, California
DEAL, BE
MACKENNA, EL
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, California
MACKENNA, EL
CASTRO, PL
论文数:
0
引用数:
0
h-index:
0
机构:
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, California
CASTRO, PL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(07)
: 997
-
&
[5]
A-C PROPERTIES OF ANODIC OXIDE FILMS ON SILICON
DREINER, R
论文数:
0
引用数:
0
h-index:
0
DREINER, R
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(11)
: 1210
-
+
[6]
EICHENWALD A, 1910, ANN PHYS, V32, P648
[7]
ELECTRIC FIELDS PRODUCED BY PROPAGATION OF PLANE COHERENT ELECTROMAGNETIC RADIATION IN A STRATIFIED MEDIUM
HANSEN, WN
论文数:
0
引用数:
0
h-index:
0
HANSEN, WN
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1968,
58
(03)
: 380
-
&
[8]
Harrick N. J., 1967, INTERNAL REFLECTION
[9]
HARRICK NJ, 1967, INTERNAL REFLECTION, P41
[10]
HARRICK NJ, 1967, INTERNAL REFLECTANCE, P262
←
1
2
3
→