DIELECTRIC MEASUREMENTS ON SUBSTRATE MATERIALS AT MICROWAVE-FREQUENCIES USING A CAVITY PERTURBATION TECHNIQUE

被引：117

作者：

DUBE, DC

LANAGAN, MT

KIM, JH

JANG, SJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 07期

关键词：

D O I：

10.1063/1.341024

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2466 / 2468

页数：3

共 23 条

[1]

ALTSCHULER HM, 1963, HDB MICROWAVE MEASUR, V2, P530

[2] MICROWAVE MEASUREMENT OF DIELECTRIC-CONSTANT OF LIQUIDS AND SOLIDS USING PARTIALLY LOADED SLOTTED WAVEGUIDE [J].

BAHL, IJ ;

GUPTA, HM .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1974, MT22 (01) :52-54

[3]

BETHE HA, 1943, NDRC D1117 REP

[4] DIELECTRIC MEASUREMENTS OF SHEET MATERIALS [J].

BHARTIA, P ;

HAMID, MAK .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1973, IM22 (01) :94-95

[5] MEASUREMENT OF THE DIELECTRIC CONSTANT AND LOSS OF SOLIDS AND LIQUIDS BY A CAVITY PERTURBATION METHOD [J].

BIRNBAUM, G ;

FRANEAU, J .

JOURNAL OF APPLIED PHYSICS, 1949, 20 (08) :817-818

[6]

Champlin K.S., 1961, IRE T MICROWAVE THEO, VMTT-9, P545, DOI 10.1109/TMTT.1961.1125387

[7]

CHAO SH, 1985, IEEE T MICROW THEORY, V33, P519, DOI 10.1109/TMTT.1985.1133108

[8] AN UNCERTAINTY ANALYSIS FOR THE MEASUREMENT OF MICROWAVE CONDUCTIVITY AND DIELECTRIC-CONSTANT BY THE SHORT-CIRCUITED LINE METHOD [J].

CHAO, SH .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1986, 35 (01) :36-41

[9]

Dube D. C., 1984, Bulletin of Materials Science, V6, P1075, DOI 10.1007/BF02743960

[10] DETERMINATION OF DIELECTRIC PARAMETERS FOR FILMS AT MICROWAVE-FREQUENCIES [J].

DUBE, DC ;

NATARAJA.R .

JOURNAL OF APPLIED PHYSICS, 1973, 44 (11) :4927-4929

← 1 2 3 →