AN UNCERTAINTY ANALYSIS FOR THE MEASUREMENT OF MICROWAVE CONDUCTIVITY AND DIELECTRIC-CONSTANT BY THE SHORT-CIRCUITED LINE METHOD

被引：11

作者：

CHAO, SH

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1986年 / 35卷 / 01期

关键词：

D O I：

10.1109/TIM.1986.6499053

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：36 / 41

页数：6

共 15 条

[1]

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