INFLUENCE OF WAVEGUIDE CONTACT ON MEASURED COMPLEX PERMITTIVITY OF SEMICONDUCTORS

被引：40

作者：

CHAMPLIN, KS

GLOVER, GH

机构：

来源：

关键词：

D O I：

10.1063/1.1708817

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2355 / &

共 19 条

[1]

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[2]

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[3]

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[4]

CARDONA M, 1960, SOLID STATE PHYS, V1, P206

[5] CHARGE CARRIER INERTIA IN SEMICONDUCTORS [J].

CHAMPLIN, KS ;

ARMSTRONG, DB ;

GUNDERSON, PD .

[6]

CHAMPLIN KS, 1962, P IRE, V50, P232

CHAMPLIN, KS .

PHYSICA, 1962, 28 (11) :1143-&

[8]

CHAMPLIN KS, 1963, IEEE T MICROWAVE THE, VMT11, P73

[9]

CHAMPLIN KS, 1960, IRE T ELECTRON DEV, VED 7, P29

DALTROY, FA ;

FAN, HY .

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