APPLICATIONS OF SCATTERING SPECTROMETRY WITH FAST PROTONS (5-8MEV) AND HEAVY-IONS (15-25 MEV) TO SPECIAL ANALYSIS PROBLEMS

被引：14

作者：

MULLER, P

SZYMCZAK, W

ISCHENKO, G

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1978年 / 149卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(78)90867-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：239 / 245

页数：7

共 19 条

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FOTI, G
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RIMINI, E
[J]. THIN SOLID FILMS, 1973, 19 (02) : 339 - 348
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[6] ISCHENKO G, UNPUBLISHED
[7] ISCHENKO G, 1977, PHYSIK UNSERER ZEIT, V6
[8] NEW PRECISION TECHNIQUE FOR MEASURING CONCENTRATION VERSUS DEPTH OF HYDROGEN IN SOLIDS
LANFORD, WA
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[J]. APPLIED PHYSICS LETTERS, 1976, 28 (09) : 566 - 568
[9] MULLER P, 1976, J APPL PHYS, V47, P2811, DOI 10.1063/1.323077
[10] MULLER P, 1976, ION BEAM SURFACE LAY, V1, P265