共 16 条
- [1] DEPTH SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS BY MEANS OF SCATTERED ELECTRONS [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 115 (02): : 373 - 380
- [2] ELECTROSTATIC SPECTROMETER FOR CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 154 (02): : 401 - 403
- [3] SIMPLE METHOD FOR ANALYSIS OF DEPTH-SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 118 (01): : 313 - 316
- [4] BENCZERKOLLER N, 1977, 1977 WORKSH NEW DIR, V38, P107
- [5] METHOD OF ANALYSIS OF THIN SURFACE LAYERS BY MOSSBAUER EFFECT [J]. NUCLEAR INSTRUMENTS & METHODS, 1969, 70 (01): : 36 - &
- [6] DOMKE M, 5TH P INT C HYP INT
- [7] Ibach H., 1977, Electron spectroscopy for surface analysis, P1
- [8] ANALYSIS OF BACKSCATTER MOSSBAUER-SPECTRA OBTAINED WITH INTERNAL-CONVERSION ELECTRONS [J]. NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (01): : 93 - +
- [9] ANALYSIS OF ELECTRON-TRANSPORT IN CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (CEMS) [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 155 (03): : 529 - 538
- [10] INTERPRETATION AND PRACTICAL ANALYSIS OF DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTRA [J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 160 (01): : 131 - 136